International Conference on Deep Learning for Image-Based Defect Detection

ICDLIBDD

Tue, Jul 14, 2026 - Wed, Jul 15, 2026Matola, Mozambique

Conference Overview

The main purpose of International Conference on Deep Learning for Image-Based Defect Detection is to bring industry professionals, experts, academicians, and scholars to discuss their expertise for better collaboration in the field.

Official Website

Important Dates

Start Date

Tuesday, July 14, 2026

End Date

Wednesday, July 15, 2026

Registration Deadline

Monday, June 29, 2026

Submission Deadline

Wednesday, June 24, 2026

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Organizer

World Academics

John Richardson

info@worldacademics.net

Venue

Ibis Seef Hotel Bahrain
Ibis Seef Hotel Bahrain Bldg. 456
manama
Bahrain

Matola, Mozambique

Call for Papers

Submit your research and be a part of an engaging academic exchange.

•deep learning
•image-based defect detection
•computer vision
•predictive modeling

+16 More Topics View All Call for Papers

Session Tracks

Explore key themes and topics to be covered in this conference.

•Data Science

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Quick Info

Type

Conference

Country

Mozambique

Month

July-2026

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By Topic

Engineering

By Country

Mozambique

By City

Matola

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