ICDLIBDD
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Start Date
Monday, July 6, 2026
End Date
Tuesday, July 7, 2026
Registration Deadline
Sunday, June 21, 2026
Submission Deadline
Tuesday, June 16, 2026
Hyatt Regency Santa Clara
5101 Great America Pkwy
Santa Clara
CA 95054
, United States
Santa Clara, Cuba
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Abu Dhabi, United Arab Emirates
December-2026
Havana
October-2026
Santa Clara
October-2026
Santiago de Cuba
October-2026
Havana
October-2026
Cuba
October-2026
Cuba
October-2026
Cuba
October-2026
Cuba
October-2026
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