ICDLIBDD
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Start Date
Thursday, May 28, 2026
End Date
Friday, May 29, 2026
Registration Deadline
Wednesday, May 13, 2026
Submission Deadline
Friday, May 8, 2026
Swissôtel Sydney
68 Market St,
Sydney NSW 2000,
Australia
Sydney, New South Wales, Australia
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Abu Dhabi, United Arab Emirates
December-2026
Sydney
December-2026
Sydney
December-2026
Melbourne
December-2026
Sydney
December-2026
Australia
December-2026
Australia
December-2026
Australia
December-2026
Australia
December-2026
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