ICDLIBDD
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Start Date
Tuesday, March 17, 2026
End Date
Wednesday, March 18, 2026
Registration Deadline
Monday, March 2, 2026
Submission Deadline
Monday, March 2, 2026
Tune Hotel - Nairobi
155 Rhapta Road
Nairobi
Kenya
Nairobi, Nairobi Area, Kenya
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Abu Dhabi, United Arab Emirates
December-2026
Malindi
October-2026
Malindi
October-2026
Malindi
October-2026
Malindi
October-2026
Kenya
October-2026
Kenya
October-2026
Kenya
October-2026
Kenya
October-2026
© 2026 Academic World Research. All rights reserved.