ICDLIBDD
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Start Date
Friday, March 13, 2026
End Date
Saturday, March 14, 2026
Registration Deadline
Thursday, February 26, 2026
Submission Deadline
Thursday, February 26, 2026
Bernina Hotel Geneva
Place de Cornavin 22,
1201 Genève,
Switzerland
Geneva, Geneve, Switzerland
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Abu Dhabi, United Arab Emirates
December-2026
Zurich
December-2026
Zurich
December-2026
Geneva
December-2026
Geneva
December-2026
Switzerland
December-2026
Switzerland
December-2026
Switzerland
December-2026
Switzerland
December-2026
© 2026 Academic World Research. All rights reserved.