ICDLIBDD
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Start Date
Saturday, March 21, 2026
End Date
Sunday, March 22, 2026
Registration Deadline
Friday, March 6, 2026
Submission Deadline
Friday, March 6, 2026
Soaltee Westend Premier Messe Frankfurt
Oeserstrabe 180,
65933 Frankfurt am Main,
Germany.
Frankfurt, Germany
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Dubai, United Arab Emirates
December-2026
Abu Dhabi, United Arab Emirates
December-2026
Munich
December-2026
Berlin
December-2026
Frankfurt
December-2026
Hamburg
December-2026
Germany
December-2026
Germany
December-2026
Germany
December-2026
Germany
December-2026
© 2026 Academic World Research. All rights reserved.